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High-speed switching for ultrafast electromechanical switches and sensors
by Staff Writers
3Tokyo, Japan (SPX) Aug 30, 2017


The (a-f) capacitance, strain, tilting angle, intensity, difference capacitance, and volume fraction of the c domain were measured as functions of time, respectively. The elastic deformation and ferroelastic domain switching were completed within 40 ns.

Unlike the slow ferroelastic domain switching expected for ceramics, high-speed sub-microsecond ferroelastic domain switching and simultaneous lattice deformation are directly observed for the Pb(Zr0.4Ti0.6)O3 thin films. This exciting finding paves the way for high-frequency ultrafast electromechanical switches and sensors.

Piezo micro electro mechanical systems (piezoMEMS) are miniaturized devices exhibiting piezoelectricity, i.e., the appearance of an electric charge under applied mechanical stress. These devices have many diverse applications in energy harvesters, micropumps, sensors, inkjet printer heads, switches, and so on. In permanently polarized (ferroelectric) materials, ferroelastic domain switching affects the piezoelectric properties significantly, and this behavior can be exploited for piezoMEMS applications.

Pb(Zr1-xTix)O3 (PZT) thin films have excellent piezoelectric and ferroelectric properties; therefore, they are potential candidates for MEMS applications. Under an applied electric field, both lattice elongation and 90 degrees ferroelastic domain switching are observed in tetragonal PZT thin films. In particular, non-180 degrees ferroelastic domain switching has important implications for the future realization of high-performance piezoMEMS devices.

However, before the recent investigation, the speed of this 90 degrees domain switching was unknown. In addition, the relationship between the speeds of the lattice deformation and ferroelastic domain switching had not been determined. To investigate these speeds, the research team led by Hiroshi Funakubo examined the switching behavior of Pb(Zr0.4Ti0.6)O3 thin films under applied rectangular electric field pulses.

To observe the changes in the lattice and the domain structure, time-resolved in situ synchrotron X-ray diffraction was carried out in synchronization with a high-speed pulse generator.

These observations were performed at the BL13XU beamline at the SPring-8 synchrotron radiation facility. The electric field pulses were applied to the PZT thin films through Pt top electrodes, which were fabricated on top of the films.

Investigation of the diffraction peaks in the PZT thin films revealed elongation of the surface normal c-axis lattice parameter of the c-domain with a simultaneous decrease in the surface normal a-axis lattice parameter of the a-domain under the applied electric field. The intensities of the diffraction peaks also changed under the electric field. These observations provided direct evidence of 90 degrees domain switching.

To determine the switching speed, the lattice elongation and domain switching behaviors were plotted as functions of time (Figure 1). These plots revealed that these processes were completed within 40 ns and occurred simultaneously in response to the applied electric field. The switching behavior was also shown to be perfectly repeatable.

The high-speed switching observed in these experiments was limited by the present electrical equipment, but is faster than that reported in previous studies. Further, this high-speed 90 degrees switching is reversible and can be used to enhance the piezoelectric response in piezoMEMS devices by several tens of nanoseconds. Therefore, this finding is of considerable importance for the ongoing development of ultrafast electromechanical switches and sensors.

Yoshitaka Ehara, Shintaro Yasui, Takahiro Oikawa, Takahisa Shiraishi, Takao Shimizu, Hiroki Tanaka, Noriyuki Kanenko, Ronald Maran, Tomoaki Yamada, Yasuhiko Imai, Osami Sakata, Nagarajan Valanoor, and Hiroshi Funakubo*, In-situ observation of ultrafast 90 degrees domain switching under application of an electric field in (100)/ (001)-oriented tetragonal epitaxial Pb(Zr0.4Ti0.6)O3 thin films, Scientific Reports, 10.1038/s41598-017-09389-6

CHIP TECH
Conformal metasurface coating eliminates crosstalk and shrinks waveguides
University Park PA (SPX) Aug 28, 2017
The properties of materials can behave in funny ways. Tweak one aspect to make a device smaller or less leaky, for example, and something else might change in an undesirable way, so that engineers play a game of balancing one characteristic against another. Now a team of Penn State electrical engineers have a way to simultaneously control diverse optical properties of dielectric waveguides by us ... read more

Related Links
Tokyo Institute of Technology
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